The core activity of K2 Photonics is the development and manufacturing of ultra-fast lasers, particularly dual-comb lasers, for precise sensing applications such as pump-probe spectroscopy, layer thickness measurement, gas sensing and process control, as well as precision distance measurement.
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Dual-comb laser systems for precise measurement applications; compact single-cavity architecture, two spatially separated pulse trains, ultrashort pulses, low noise values, and stable repetition-rate difference.
Dual-comb system (K2-1000)
1 GHz dual-comb laser system for dual-comb spectroscopy and ranging; two pulse trains with high power per beam, <100 fs pulse duration, compact design, and optional SHG, fibre coupling, or supercontinuum.
Ultrashort-pulse laser (K2-1000-mini)
Compact 1 GHz ultrashort-pulse laser for OEM integration; mode-locked femtosecond light source or dual-comb option, high power per beam, ultralow noise, and optional wavelength and fibre solutions.
Optical parametric oscillator (K2-OPO-mini)
Compact, fully integrated OPO with 1 GHz repetition rate, high power, and ultrashort pulses; fixed or adjustable infrared wavelengths, dual-comb option, and fibre/pump outputs.
ASOPS laser system (K2-ASOPS)
Single-cavity dual-comb laser for pump-probe measurements; two spatially separated pulse trains, sub-cycle timing jitter, ultralow noise, compact design, turnkey operation, and options for SHG, THG, and cooling.
Dual-comb spectroscopy
High-resolution gas spectroscopy with fast update rates; measurement of gas composition and concentration without mechanical scanning, suitable for process control and real-time monitoring.
Precision distance measurement
Dual-comb LiDAR for precise distance measurements; long unambiguous range, high measurement speed, femtosecond precision, and compact systems for ranging applications.
Pump-probe sampling
Fast and precise thin-film inspection for pump-probe measurements; use of the lasers for time-resolved analysis and materials testing.
Thin- and thick-film inspection
Material inspection with THz-TDS as well as thin-film and thick-film applications; used for precise inspection of layers and materials.